JEOL JEM 1010 TRANSMISSION ELECTRON MICROSCOPE (TEM)
Location: Egan Research Center, Room 106
Status: Operational
Booking: Through Priority Software® FBS
Description: JEOL JEM 1010 TEM is a 100 keV transmission electron microscope (TEM) with a thermionic gun. The JEOL JEM 1010 TEM is a high contrast electron microscope due to its electron-optics and low 60-100 keV operating voltage. In addition, it is equipped with a 2k x 2k AMT CCD camera for digital image acquisition. We currently use this TEM mainly to image biological materials. However, it is possible to perform selected area diffraction (SAED) for materials science applications.
Instrument Specifications:
| Electron Source | Precentered hairpin type tungsten filament |
|---|---|
| Accelerating Voltage | 40kv-100kv |
| Operation Modes | Bright Field Dark Field Diffraction |
| Magnification | Low Mag Mode 50x to 1,000x Standard Mag Mode 600x to 500,000x |
| TEM Resolution | 0.45nm point to point |
| Sample Holders | Jeol single tilt with two specimens capacity |
| Tilt Angles | X-tilt +/-60° |
| Image Recording | 2048×2048 pixels AMT XR-41B Bottom Mount CCD with Mid-Range Phosphor Placement |
______________________________________________________________________________________________________________________________
JEOL 2010F SCANNING TRANSMISSION ELECTRON MICROSCOPE (STEM)
Location: Dana Research Center, Room 020
Status: Operational
Booking: Through Priority Software® FBS
Description: JEOL JEM 1010 TEM is a field emission high-resolution scanning transmission electron microscope (STEM). This microscope can provide atomic lattice images, selected area electron diffraction (SAED), converged-beam electron diffraction (CBED), nano-beam electron diffraction (NBED) and high-angle annular dark field (HAADF) imaging.
Instrument Specifications:
| Electron Source | Schottky field emission gun (zirconated tungsten) |
|---|---|
| Accelerating Voltage | 200kv |
| Operation Modes | Bright Field Dark Field Diffraction STEM |
| Magnification | 50x to 1.5Mx |
| TEM Resolution | 0.19nm point to point 0.1nm lattice |
| Sample Holders | Jeol single tilt Jeol double tilt holder |
| Tilt Angles | X-tilt +/-30° Y-tilt +/- 15° |
| Image Recording | Gatan Ultrascan CCD |
