JEOL JEM 1010 TRANSMISSION ELECTRON MICROSCOPE (TEM)

Location: Egan Research Center, Room 106

Status: Operational

Booking: Priority Software® FBS

Description: JEOL JEM 1010 TEM is a 100 keV transmission electron microscope (TEM) with a thermionic gun. The JEOL JEM 1010 TEM is a high contrast electron microscope due to its electron-optics and low 60-100 keV operating voltage. In addition, it is equipped with a 2k x 2k AMT CCD camera for digital image acquisition. We currently use this TEM mainly to image biological materials. However, it is possible to perform selected area diffraction (SAED) for materials science applications.

Instrument Specifications:

Electron SourcePrecentered hairpin type tungsten filament
Accelerating Voltage40kv-100kv
Operation ModesBright Field
Dark Field
Diffraction
MagnificationLow Mag Mode 50x to 1,000x
Standard Mag Mode 600x to 500,000x
TEM Resolution0.45nm point to point
Sample HoldersJeol single tilt with two specimens capacity
Tilt AnglesX-tilt +/-60°
Image Recording2048×2048 pixels AMT XR-41B Bottom Mount CCD with Mid-Range Phosphor Placement

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JEOL 2010F SCANNING TRANSMISSION ELECTRON MICROSCOPE (STEM)

Location: Dana Research Center, Room 020

Status: Operational

Booking: Priority Software® FBS

Description: JEOL JEM 1010 TEM is a field emission high-resolution scanning transmission electron microscope (STEM). This microscope can provide atomic lattice images, selected area electron diffraction (SAED), converged-beam electron diffraction (CBED), nano-beam electron diffraction (NBED) and high-angle annular dark field (HAADF) imaging.

Instrument Specifications:

Electron SourceSchottky field emission gun (zirconated tungsten)
Accelerating Voltage200kv
Operation ModesBright Field
Dark Field
Diffraction
STEM
Magnification50x to 1.5Mx
TEM Resolution0.19nm point to point
0.1nm lattice
Sample HoldersJeol single tilt
Jeol double tilt holder
Tilt AnglesX-tilt +/-30°
Y-tilt +/- 15°
Image RecordingGatan Ultrascan CCD